CRAIC Technologies has introduced the 20/30 XL™ UV-visible-NIR microspectrophotometer, which is designed to non-destructively analyze microscopic features of very large samples when integrated into large scale sample handling machinery. The unit has a spectral range from the deep ultraviolet to the near infrared, so sample analysis can be done by absorbance, reflectance, Raman, luminescence and fluorescence with speed and accuracy. The system can also be configured to image microscopic sample areas in the UV and NIR regions in addition to high resolution color imaging. Its flexible design gives it the ability to analyze large samples, and it can perform tasks such as:
- Mapping color and intensity variations of flat panel displays
- Measuring film thickness across the entire surface of 300 mm wafers
- scanning the surfaces of hard disks for defects
- Analyzing entire paintings with high spatial resolution
CRAIC Technologies, Inc.