Keithley Instruments, a provider of advanced electrical test instruments and systems, will broadcast a free, web-based seminar, entitled 'New Methods for Testing Flash Memory' on 20 May 2010.
This one-hour presentation will examine new developments, such as multi-level cell (MLC), that are aimed at achieving increased density.
The webinar will also explore advancements in measurement techniques and capabilities, from characterising a single transistor for development purposes to integrated and automated solutions for Flash production.
During the webinar, the fundamentals of Flash technology testing will be reviewed and there will be a discussion about Fowler-Nordheim (FN) and Hot Electron Injection (HEI) programming and erasing.
Different aspects of testing applicable to single Flash transistors and Flash array testing will be considered, including standard transistor characterisation, endurance and disturb testing.
The pulse fidelity requirement for MLC testing will also be discussed.
These applications will be demonstrated via Keithley's new ultra-fast I-V test solution, which controls pulse shape and amplitude and, as a result, is suitable for MLC Flash testing, and the company's ACS software, which manages a range of testing scenarios.
The webinar is recommended for people with established Flash test setups, as well as those looking for a test solution.
It will be presented by Alex Pronin, a lead applications engineer at Keithley Instruments.
'New Methods for Testing Flash Memory' will be broadcast at 15:00 CEST (09:00 EDT) for the European audience and at 14:00 EDT for the North American audience.
The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars.
The webinar will also be archived on the company's website for those unable to attend the original broadcast.